Schematic concept formation: Feature measures and constraint redundancy as predictors |
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Authors: | Cynthia M Mavrides D R Brown |
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Institution: | 1. Mary Washington College, USA 2. Department of Psychology, Purdue University, 47907, Lafayette, Indiana
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Abstract: | Constraint redundancy (Rc) was varied in order to manipulate the statistical structure of sets of patterns. Measures of pattern features and Rc were related to the categorization by Ss who had experienced different types of preexposure to sets of patterns from the same stimulus domain. Both Rc and pattern measures were related to the categories produced by Ss in a schematic-concept-formation (SCF) task. |
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