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Empirical and conceptual problems with longitudinal trait-state models: introducing a trait-state-occasion model
Authors:Cole David A  Martin Nina C  Steiger James H
Institution:Department of Psychology and Human Development, Vanderbilt University, Nashville, TN 37203-5701, USA. david_cole@vanderbilt.edu
Abstract:The latent trait-state-error model (TSE) and the latent state-trait model with autoregression (LST-AR) represent creative structural equation methods for examining the longitudinal structure of psychological constructs. Application of these models has been somewhat limited by empirical or conceptual problems. In the present study, Monte Carlo analysis revealed that TSE models tend to generate improper solutions when N is too small, when waves are too few, and when occasion factor stability is either too large or too small. Mathematical analysis of the LST-AR model revealed its limitation to constructs that become more highly auto-correlated over time. The trait-state-occasion model has fewer empirical problems than does the TSE model and is more broadly applicable than is the LST-AR model.
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