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Transmission electron microscopy study of a new silicon nitride phase
Authors:Y. Cai  A. Zimmermann  S. Prinz  S. Krämer  F. Philipp  W. Sigle
Abstract:

An abnormally large phase, which was found in the precursor-derived Si 3.0 B 1.1 C 5.3 N 3.0 ceramics after crystallization under a nitrogen pressure of 100bar at 1800C for 3h, has been characterized by means of transmission electron microscopy and electron-energy-loss spectroscopy (EELS). EELS analysis shows that this phase consists of only silicon and nitrogen, no other elements being detected. The analysis of selected-area diffraction and convergent-beam electron diffraction in conjunction with EELS reveals that the unknown phase is a variant of silicon nitride. It has a hexagonal structure with lattice parameters a =0.737nm and c =0.536nm, and the space group P62c. .
Keywords:
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