Dislocation evolution in twins of cyclically deformed copper |
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Authors: | X. L. Guo S. X. Li |
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Affiliation: | Shenyang National Laboratory for Materials Science , Institute of Metal Research, Chinese Academy of Sciences , Shenyang 110016, China |
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Abstract: | The evolution of dislocation structure in twins of different thicknesses has been investigated in polycrystalline copper fatigued at room temperature under constant plastic axial strain amplitude control. The dislocation structure and its evolution strongly depend on twin thickness. Three critical thicknesses must be distinguished, i.e. (i) characteristic size of fatigue dislocation structures, about 1?µm; (ii) critical height of stable dislocation wall structure, about 200?nm; (iii) critical spacing of dislocation dipole, about 20?nm. It is considered that the size effect is mainly caused by twin boundaries (TBs) which play different roles on slip behaviors in twins. |
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