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High-angle annular dark field scanning transmission electron microscopy of the antiphase boundary in a rapidly solidified B2 type TiPd compound |
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| Authors: | T. Hara E. Okunishi M. Nishida |
| Affiliation: | 1. National Institute for Materials Science , Tsukuba, Ibaraki 305-0044, Japan;2. JEOL Ltd. , Akishima, Tokyo 196-8558 , Japan;3. Department of Materials Science and Engineering , Kumamoto University , 2-39-1 Kurokami, Kumamoto 860-8555 , Japan |
| Abstract: | High-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) with Z-contrast is applied to characterize the antiphase boundary (APB) of the B2 structure in a rapidly solidified TiPd melt-spun compound. The atomic shift associated with the R ?=?(1/2) a 0 ?111? type displacement vector is directly observed at the boundary. A microstructure modification of the melt-spun compound with the cooling rate during solidification is also described. |
| Keywords: | RE-based BMGs GFA thermal stability Gibbs free-energy |