Critical length scales for the deformation of amorphous metals containing nanocrystals |
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Authors: | A C Lund |
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Institution: | Department of Materials Science and Engineering , Massachusetts Institute of Technology , Cambridge, MA 02139, USA |
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Abstract: | Shear localization is studied in simulated amorphous systems containing individual nanocrystalline inclusions. Systematic variation of the inclusion diameter and the shear band thickness reveals a crossover in length scales that separates distinct plastic flow mechanisms in and around the nanocrystalline inclusion. When considered relative to the shear band thickness, small inclusions deform via heterogeneous, interface-dominated mechanisms, while large inclusions yield via the homogeneous nucleation of dislocations in the nanocrystal interior; nanocrystals roughly twice as large as the shear band width are required for the strongest interaction. |
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