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The temperature dependence of the optical dispersion parameters in Si and Ge
Authors:T Toyoda
Institution:Electronic Materials and Components Research Laboratories, Nippon Mining Co. Ltd. , 17-35, Niizo-minami 3-chome, Toda, Saitama, 335, Japan
Abstract:Abstract

In Si and Ge, the optical dispersion parameters (single-oscillator energy Eo , dispersion energy Ed and bond energy gap Eg developed by Wemple and DiDomenico, and Phillips) have been analysed in the temperature range 100-300 K using data obtained by Icenogle et al. Eo and Eg exhibit a very small temperature dependence in both materials. The thermal coefficients of the dispersion energy, dEd/dT, have opposite signs (Si, –41·9 × 10?4eVK?1; Ge, +37·7 × 10?4eVK?1).
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