Fractal characterization of rough surfaces using secondary electrons |
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| Authors: | C S Pande N Louat R A Masumura S Smith |
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| Institution: | 1. Naval Research Laboratory , Washington, DC 20375, U.S.A.;2. Crystal Growth and Materials Testing, Lanham , Maryland, 20706, U.S.A.;3. Geo Centers Inc., Suitland , Maryland, 20746, U.S.A. |
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| Abstract: | Abstract We propose a novel and rapid method of measuring the total area of a rough surface using a scanning electron microscope. We show, under certain circumstances, that this area is almost exactly proportional to the secondary electron yield from the surface. The relationship of this measurement to fractal characterization is discussed. |
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