Structural phase transitions in epitaxial SrRuO3 thin films

The microstructural evolution of epitaxial SrRuO₃ thin films from ambient temperature (about 293K) to about 900K has been studied by in-situ transmission electron microscopy. Upon heating from the ambient temperature, the intensities of h, k, 2n+1 and h, -h+2n+1, 0 reflections in selected-area electron diffraction patterns decrease with increasing temperature. Two structural phase transitions were observed at about 673and about 783K, revealed by the vanishing of the h, k, 2n+1 and h,-h+2n+1, 0 reflections respectively. The examination of electron diffraction patterns along several different zone axes, taking into account the possible tilting configurations of RuO₆ octahedra, indicates that, upon heating, the orthorhombic structure of SrRuO₃ transforms into a tetragonal structure at about 673K, and further transforms into a cubic structure at about 783K. Possible structural models for the high-temperature phases are considered.