Potential mapping of ZnO by off-axis electron holography |
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| Authors: | Y.-Z. Liu X. D. Han Z. Zhang |
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| Affiliation: | 1. Beijing National Laboratory for Condensed Matter Physics , Institute of Physics, Chinese Academy of Sciences , Beijing 100080, China yzliu@blem.ac.cn;3. Beijing University of Technology , 100 Pingle Yuan, Chao Yang District, Beijing 100022, China |
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| Abstract: | Off-axis electron holography has been used to map the electric potential derived from the spontaneous polarity in a ZnO film. A wedge-shaped ZnO film, in which the holograms and the object wave were reconstructed, was used. To interpret the phase image correctly, the reconstructed amplitude image was used to obtain information on the thickness, which was then applied to eliminate the thickness effect on the phase shift. The electric potential distribution was characterized and the polarity of the ZnO film determined. |
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| Keywords: | coarsening interface energy Al3Sc precipitate aluminium–magnesium–scandium alloy resistivity TEM |
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