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On maximizing item information and matching difficulty with ability |
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| Authors: | Peter Bickel Steven Buyske Huahua Chang Zhiliang Ying |
| Institution: | (1) Department of Statistics, University of California at Berkeley, USA;(2) National Board of Medical Examiners, USA;(3) Department of Statistics, Hill Center, Busch Campus, Rutgers University, 08854-8019 Piscataway, NJ |
| Abstract: | |
| Keywords: | item response theory item characteristic curve computerized adaptive testing Rasch model normal ogive one-parameter IRT model item information van Zwet tail ordering |
| 本文献已被 SpringerLink 等数据库收录！ | |