Using item-specific instructional information in achievement modeling

The problem of detecting instructional sensitivity (item basis) in test items is considered. An illustration is given which shows that for tests with many biased items, traditional item bias detection schemes give a very poor assessment of bias. A new method is proposed instead. This method extends item response theory (IRT) by including item-specific auxiliary measurement information related to opportunity-to-learn. Item-specific variation in measurement relations across students with varying opportunity-to-learn is allowed for.This paper was presented at the 1987 AERA meeting in Washington, DC. This research was supported by grant OERI-G-86-003 from the Office of Educational Research and Improvement, Department of Education. The author thanks Michael Hollis and Chih-fen Kao for valuable research assistance, and appreciates valuable comments made by an anonymous reviewer.