首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Construct validity of perceptual style: Role of stimulus size in the embedded-figures test and the rod-and-frame test
Authors:Michael J Streibel  Sheldon M Ebenholtz
Institution:1. Instructional Systems Program, Division of Curriculum and Instruction, Pennsylvania State University, 16802, University Park, Pennsylvania
2. Department of Psychology, University of Wisconsin, 53706, Madison, Wisconsin
Abstract:Three experiments were performed in order to test the construct validity of perceptual field dependence (FD) and field independence (FI). In Experiment 1, performance of subjects on two sizes of Form A of Witkin’s Embedded Figures Test (EFT) with a size-ratio of 1 to 4 was compared. The size of the standard EFT was taken as unity. A nonsignificant size effect was found for all subjects as a group, and a significant rank correlation was found between performances on the two sizes of the EFT. Furthermore, the performance of field-dependent subjects (as defined by performance on the standard EFT) and field-independent subjects did not interact significantly with the size factor. In Experiment 2, the physical size of the EFT changed from 1 to 8. A nonsignificant, overall size effect was again found, but the EFT performance of fielddependent and field-independent subjects interacted significantly with the size factor. In Experiment 3, the performance of subjects on two sizes of the EFT (i.e., 1 to 8) and two sizes of the standard rod-and-frame test (RFT) (i.e., 1 to 4.5) were compared. A significant stimulus-size effect was found in the EFT, with all subjects becoming morefield-independent, and a significant stimulus-size effect was found in the RFT with the same subjects becoming morefield-dependent. Finally, the EFT performance of the field-dependent and field-independent subjects again displayed a significant interaction with the size of the embedded figures. A parallel-serial processingstyles hypothesis is proposed to account for the EFT data.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号