Modern Sequential Analysis and Its Applications to Computerized Adaptive Testing |
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Authors: | Jay Bartroff Matthew Finkelman Tze Leung Lai |
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Institution: | (1) Department of Mathematics, University of Southern California, 3620 S Vermont Ave., KAP 108, Los Angeles, CA 90089, USA;(2) Harvard University, Boston, MA 02115, USA;(3) Stanford University, Stanford, CA 94305, USA |
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Abstract: | After a brief review of recent advances in sequential analysis involving sequential generalized likelihood ratio tests, we
discuss their use in psychometric testing and extend the asymptotic optimality theory of these sequential tests to the case
of sequentially generated experiments, of particular interest in computerized adaptive testing. We then show how these methods
can be used to design adaptive mastery tests, which are asymptotically optimal and are also shown to provide substantial improvements
over currently used sequential and fixed length tests. |
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