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Modern Sequential Analysis and Its Applications to Computerized Adaptive Testing
Authors:Jay Bartroff  Matthew Finkelman  Tze Leung Lai
Institution:(1) Department of Mathematics, University of Southern California, 3620 S Vermont Ave., KAP 108, Los Angeles, CA 90089, USA;(2) Harvard University, Boston, MA 02115, USA;(3) Stanford University, Stanford, CA 94305, USA
Abstract:After a brief review of recent advances in sequential analysis involving sequential generalized likelihood ratio tests, we discuss their use in psychometric testing and extend the asymptotic optimality theory of these sequential tests to the case of sequentially generated experiments, of particular interest in computerized adaptive testing. We then show how these methods can be used to design adaptive mastery tests, which are asymptotically optimal and are also shown to provide substantial improvements over currently used sequential and fixed length tests.
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