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1.
Abstract

In this work results of a Monte Carlo simulation of the ion penetration in a crystalline silicon target are reported. It is shown that, contrary to the common expectation, channelling is sustained by a non-vanishing divergency of the ion beam for a nominally random orientation of the target.  相似文献   
2.
The effects of crystallization on the electron work function and corrosion resistance of Zr65Al7.5Cu17.5Ni10 amorphous alloys have been studied. The single-phase amorphous alloy exhibits a better corrosion resistance and has a higher work function than the partially and fully crystallized alloys with the same composition. The close relationship between corrosion resistance and work function indicates that the Kelvin probe technique can be a powerful tool for characterizing the corrosion behaviour of amorphous alloy on an electronic level.  相似文献   
3.
We report the study of the effect of strain rate on the compressive behaviour of a Zr56Al10.9Ni4.6Cu27.8Nb0.7 bulk metallic glass. The results indicated that both the strength and plasticity of the glass increase with increasing the strain rate up to 10?5 s?1, above which the strength and plasticity start to decrease. The enhanced mechanical properties under a strain rate of 10?5 s?1 are due to the emission/propagation rate of the shear bands being consistent with the strain rate.  相似文献   
4.
To understand the direct correlation between photodarkening (PD) and photoinduced defect creation (PDC) observed in amorphous chalcogenides, in situ simultaneous measurements of PD and photocurrent (PC) have been performed on amorphous As2Se3 films. The time evolution of PD and PDC during light excitations are empirically described by a stretched exponential function; 1 ??exp[?(t/τ) β ], where τ is the effective response time and β the dispersion parameter. The value of τ for the PDC is very much smaller than that for the PD, suggesting that there is no direct correlation between the two.  相似文献   
5.
It is interesting to investigate the formation of He bubbles in amorphous alloys because point defects do not exist in amorphous materials. In the present study, the microstructural evolution of amorphous Fe79B16Si5 alloy, either irradiated with 5?keV He+ ions or implanted with 150?eV He+ ions without causing displacement damage, and then annealed at a high temperature, was investigated using transmission electron microscopy (TEM). Vacancy-type defects were formed in the amorphous alloy after irradiation with 5?keV He+ ions, and He bubbles formed during annealing the irradiated samples at high temperature. On the other hand, for samples implanted with 150?eV He+ ions, although He atoms are also trapped in the free volume, no He bubbles were observed during annealing the samples even up to 873?K. In conclusion, the formation of He bubbles is related to the formation and migration of vacancy-type defects even in amorphous alloys.  相似文献   
6.
7.
We have found that a shuffle-set dislocation is nucleated in a semiconductor silicon device subjected to severe thermal processing. The dislocation transforms into a dissociated glide-set dislocation after annealing at 500°C. A possible mechanism for the nucleation of a perfect shuffle-set dislocation during thermal processing is that the dislocation nucleus was nucleated at a low temperature during prior ion-implantation processing.  相似文献   
8.
A 52 m drop tube has been used to solidify bulk-glass-forming Zr41Ti14Cu12.5Ni10Be22.5 alloy. Glassy balls with different sizes solidified from the droplets whose structural features, glass-transition behaviour and crystallization kinetics have been investigated. The results indicate that the apparent activation energies of the glass transition and main crystallization reaction are significantly different from those of samples prepared by water quenching. The structural difference between the two types of glassy specimen is revealed by compression studies and in situ energy-dispersive X-ray diffraction. The results are important for understanding the structural features of bulk-forming glasses.  相似文献   
9.

The critical current densities of superconducting thin films and their dependence on the film structural characteristics has been a major research interest for more than a decade. Controlling this relationship is crucial if large-scale high-quality YBa 2 Cu 3 O 7 (YBCO) tapes are to be produced. Two major keystones of information have been established in this field. Firstly, there is a direct relationship between the critical current density and the grain-boundary angle in polycrystalline YBCO films. Grain boundaries with a mismatch angle higher than 5° usually result in reduced critical current densities. This detrimental effect of large-angle grain boundaries to the quality of YBCO films has been attributed to strain fields resulting from such grain boundaries. Secondly, the quality of the YBCO film can be enhanced by straining its lattice in specific direction. Here, we report, for the first time, direct experimental results coupling local grain orientation and local strain maps of thin YBCO films deposited on a (001) biaxially textured nickel substrate. These results were correlated to the quality of the film and showed how grain structure in the nickel substrate affects the grain structure in the YBCO films even in the presence of several buffer layers. More importantly, the data show that highquality films with high critical current densities can be produced, in spite of large-angle grain boundaries, if the film is compressed in the range of 0.5% strain normal to the a axis.  相似文献   
10.
The effects of irradiation with electrons having energies in the range 0.7–1.7 MeV on the dark conductivity and the network of hydrogenated amorphous silicon (a-Si:H) thin films have been studied. The dark conductivity measurements show that electron irradiation leads to a degradation in the dark conductivity, with the degradation being greater at lower electron energies. The Raman results suggest that the irradiation induces structural defects in the a-Si:H films, with the lower energy electrons producing more disorder in the amorphous network.  相似文献   
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