A latent topic model with Markov transition for process data

We propose a latent topic model with a Markov transition for process data, which consists of time-stamped events recorded in a log file. Such data are becoming more widely available in computer-based educational assessment with complex problem-solving items. The proposed model can be viewed as an extension of the hierarchical Bayesian topic model with a hidden Markov structure to accommodate the underlying evolution of an examinee's latent state. Using topic transition probabilities along with response times enables us to capture examinees' learning trajectories, making clustering/classification more efficient. A forward-backward variational expectation-maximization (FB-VEM) algorithm is developed to tackle the challenging computational problem. Useful theoretical properties are established under certain asymptotic regimes. The proposed method is applied to a complex problem-solving item in the 2012 version of the Programme for International Student Assessment (PISA).     

A Latent Block Distance-Association Model for Profile by Profile Cross-Classified Categorical Data

Abstract

Distance association models constitute a useful tool for the analysis and graphical representation of cross-classified data in which distances between points inversely describe the association between two categorical variables. When the number of cells is large and the data counts result in sparse tables, the combination of clustering and representation reduces the number of parameters to be estimated and facilitates interpretation. In this article, a latent block distance-association model is proposed to apply block clustering to the outcomes of two categorical variables while the cluster centers are represented in a low dimensional space in terms of a distance-association model. This model is particularly useful for contingency tables in which both the rows and the columns are characterized as profiles of sets of response variables. The parameters are estimated under a Poisson sampling scheme using a generalized EM algorithm. The performance of the model is tested in a Monte Carlo experiment, and an empirical data set is analyzed to illustrate the model.