学习十九届五中全会精神(笔会)

党的十九届五中全会通过了《中共中央关于制定国民经济和社会发展第十四个五年计划和二〇三五年远景目标的建议》,开启了全面建设社会主义现代化国家新征程。会议鼓舞人心,引人深思,催人奋进。由教育部人文社会科学重点研究基地李萍所长倡议,中山大学马克思主义哲学与中国现代化研究所暨哲学系、广东哲学学会、广东伦理学学会、广东马克思主义学会、现代哲学杂志社,联合组织了以“新时代·新理念·新格局”为主题的“学习贯彻党的十九届五中全会精神”的视频会议,哲学界尤其是马克思主义哲学专业近二十位专家与会,交流学习心得,共商学术大是。这里刊登部分发言。本刊后续还将组织此一主题的专栏文章。     

Correction to: Graph Theoretical Analysis of Brain Network Characteristics in Brain Tumor Patients: A Systematic Review

Neuropsychology Review -     

Potential mapping of ZnO by off-axis electron holography

Off-axis electron holography has been used to map the electric potential derived from the spontaneous polarity in a ZnO film. A wedge-shaped ZnO film, in which the holograms and the object wave were reconstructed, was used. To interpret the phase image correctly, the reconstructed amplitude image was used to obtain information on the thickness, which was then applied to eliminate the thickness effect on the phase shift. The electric potential distribution was characterized and the polarity of the ZnO film determined.     

Study on the deformation of nanocrystalline cobalt

A study was carried out on the deformation of nanocrystalline cobalt. For cold-rolled nanocrystalline cobalt, the X-ray diffraction peaks narrowed instead of broadened on deformation. The results of transmission electron microscopy showed that grain size (17.8?nm on average) was not increased. The results can be explained in terms of the production and activity of vacancies and vacancy clusters.     

Inversion domain boundary in a ZnO film

Transmission electron microscopy has been used to investigate the (1100) and (1103) inversion domain boundaries in a ZnO film prepared by molecular beam epitaxy. The inversion domain was revealed by dark-field images and confirmed by convergent-beam electron diffraction. Interacting with a (0002) stacking fault, the inversion domain boundary in the (1100) plane alters its orientation from the [0001] direction and climbs on the (1103) plane to release the strain energy. These features are characterized and analysed by high-resolution electron microscopy and the geometric phase method. The findings are significant for understanding the formation and propagation of inverse domain boundaries in epitaxial ZnO films.