Enhanced grain growth in yttria-doped zirconia thin film structures synthesized under photon irradiation

Enhanced grain growth in ultra-thin yttria-doped zirconia (YDZ) films synthesized under ultraviolet (UV) irradiation is reported. The mean grain size in UV-synthesized 7.5 mol% YDZ films nearly 56 nm thick increased to 85 nm upon annealing in an oxygen-rich ambient at 900°C for 1 h, while in thermally grown YDZ they grew only to ～15 nm under identical annealing conditions. In situ electron microscopy kinetic studies reveal an enhanced kinetic constant and self-limiting grain growth behaviour in the UV-synthesized oxide films. The difference between UV and thermally grown films was not significant in undoped films when compared to the case of 7.5 mol% YDZ.     

Creep strengthening by lath boundaries in 9Cr ferritic heat-resistant steel

The interactions between dislocations and lath boundaries in Grade 91 steel were observed by an in situ transmission electron microscopy tensile test at 973 K. Dislocations glided slowly and bowed out in a martensite lath interior. The ends of the dislocation were connected to the lath boundaries. In a tempered specimen, the pinning stress caused by the lath boundary was estimated to be >70 MPa with a lath width of 0.4 μm. In crept specimens, lath coarsening reduced the pinning effect.     

Type II twinning in devitrite,Na2Ca3Si6O16

Nanometre-scale twins found in the triclinic crystalline phase devitrite, Na₂Ca₃Si₆O₁₆, are shown to exhibit the relatively rare form of twinning, Type II twinning, in which the crystal structure of one of the parts is related to the crystal structure of the other by a rotation of 180° about η ₁?=?[1?0?0]. Although formally, the twin plane K ₁ is irrational, it is in essence (0?1?0).     

Twin-coupled domain structures in epitaxial relaxor ferroelectric Ba(Zr,Ti)O3 thin films on (001) MgO substrate

We report the twin-coupled multi-oriented domain structures in the epitaxial BZT20 (20%Zr) films grown on the (001) MgO substrate using pulsed-laser deposition. Transmission electron microscopy shows that the film consists of an epitaxial layer of pseudo-cubic perovskite structure and a nanopillar layer of multi-oriented twin domain structures near the surface. Four types of the twin domains were formed in the nanopillar layers by coherently joining their {111} with the epilayer and aligning their ?110? directions parallel to the ?110? axes of the epilayer. A non-uniform polarization switching behavior was observed due to the formation of such complex structure in the BZT20 films.     

Investigation of {111} stacking faults and nanotwins in epitaxial BaTiO3 thin films by high-resolution transmission electron microscopy

{111} stacking faults and nanotwins in epitaxial BaTiO₃ thin films on MgO substrates have been investigated by high-resolution transmission electron microscopy. In many cases, the stacking faults and nanotwins were found to be accompanied by partial dislocations. These partial dislocations can be classified as two different types, analogous to the situation in the fcc structure. One is of the Shockley type with the Burgers vector (a/3)<112>. The other is of the Frank type with the Burgers vector (a/3)<111>. The movements of both types of partial can lead to the {111} stacking faults and the {111} twins observed in these films.