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A stochastic model for test-retest correlations
Authors:Donald G. Morrison
Affiliation:(1) Graduate School of Business, Columbia University, 10027 New York, New York
Abstract:A simple stochastic model is formulated in order to determine the optimal time between the first test and the second test when the test-retest method of assessing reliability is used. A forgetting process and a change in true score process are postulated. The optimal time between tests is derived by maximizing the probability that the respondent has not remembered the response on the first test and has not had a change in true score. The resulting test-retest correlation is then found to be a linear function of the true reliability of the test, where the slope of this function is the key probability of not remembering and having no change in true score. Some numerical examples and suggestions for using the results in empirical studies are given. Specific recommendations are presented for improved design and analysis of intentions data.This research was made possible by a grant from the Center for Food Policy Research, Graduate School of Business, Columbia University, New York, New York, 10027.
Keywords:reliability  forgetting  true score  optimal time interval  exponential distribution  individual differences
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